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Casella USA will be showing a completely new DSP based noise
meter at the upcoming show in Chicago in May 2006. Designed for the busy
industrial hygienist, the new meter is "a little gem" according to Tim Turney,
product manager for Casella CEL in the UK.
He says "we have looked very carefully at what customers have
been saying to us and produced a new noise meter that will satisfy 99.9% of the
most requested tasks for not only an experienced user but also a novice in the
field of industrial noise measurements."
The noise meter is bound to be a popular choice given the
long experience of the Casella CEL engineers at providing noise measurement
solutions and we are anticipating a busy time at the Casella USA booth, number
233, at the AIHA exhibition at the McCormick Center in Chicago from May 15 to
17th.
Casella USA will be featuring a simple drawing at the show
for the chance to win a complete measurement kit based on the all new meter. The kit will
feature all the items needed to carry out comprehensive noise surveys in the
workplace including an a new pc software package designed to assist the user in
producing hard copies for OSHA reporting.
So come along to booth number 233 and see for yourself how
Casella CEL have the answer yet again and enter to win one of these exciting new
kits by answering a really simple question. The winner will be drawn from the
entries at the close of the show on Wednesday 17th May and if not present at the
booth will be notified by phone within 48 hours and will receive their kit as
soon as available in the USA. New deliveries are planned for June 2006 so enter
the competition to become one of the first to take delivery of the next
generation noise measurement solution.
Remember, "the best things come in small packages!"
Learn more about the new Casella
CEL noise meter by visiting us at
Booth 233, AIHA exhibition, McCormick Place, Chicago, Illinois May 15 to
17 for a
chance to win a complete measurement kit worth over $2,500 or
contact your local Casella USA sales office and request
further
information.
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